DFT (Design for Testability) Services

Our expertise in implementing robust DFT methodologies enhances test coverage, reduces manufacturing defects, and improves yield.

DFT Services 2

DFT (Design for Testability) Services

ISLV Semi Conductor Technologies specializes in Design for Testability (DFT) services, ensuring your integrated circuits (ICs) are test-ready and defect-free before production. Our expertise in implementing robust DFT methodologies enhances test coverage, reduces manufacturing defects, and improves yield, resulting in cost-effective and reliable IC production.

Our Services

Our DFT Services Include

Scan Insertion

We implement scan-based testing methods that simplify the testing of complex digital designs. Our scan insertion process includes the design and integration of scan chains, facilitating easier identification and diagnosis of manufacturing faults. By enabling comprehensive scan coverage, we help reduce the risk of undetected defects in your design.

Automatic Test Pattern Generation (ATPG)

Our team generates high-coverage ATPG patterns to detect stuck-at and transition faults efficiently. These patterns are designed to achieve maximum fault coverage, ensuring that manufacturing defects are identified during the testing process. We focus on minimizing the pattern count to reduce test time and cost while maintaining high coverage.

Built-In Self-Test (BIST) Implementation

BIST structures provide a way for ICs to test themselves, offering a cost-effective solution for testing complex designs. Our BIST services include memory BIST (MBIST) and logic BIST (LBIST) implementation, enabling on-chip testing capabilities that reduce the need for expensive external test equipment and ensure high reliability in the field.

JTAG and Boundary Scan

We integrate IEEE 1149.1 standard JTAG (Joint Test Action Group) and boundary scan architectures into your design, allowing for efficient board-level testing and in-system debugging. This solution facilitates easier diagnosis of board interconnect issues and provides access to internal test points, enabling comprehensive testing even after packaging.

Design for Yield (DFY) Optimization

Our DFY services focus on enhancing the manufacturability and testability of your design. By identifying potential yield detractors during the design phase, we implement design modifications that improve the overall yield of your chips. This proactive approach reduces the likelihood of costly rework and increases the profitability of your production runs.

Fault Coverage Analysis and Improvement

We perform detailed fault coverage analysis to evaluate the effectiveness of test patterns. Our team identifies low-coverage areas and implements strategies to improve test efficiency. This ensures that your design is thoroughly validated and ready for mass production, minimizing the risk of defects slipping through the testing process.

Why Choose ISLV Semi

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Expertise in DFT Methodologies

With years of experience in DFT techniques, our engineers are well-versed in the latest industry standards and best practices.

We offer end-to-end DFT solutions, from scan insertion to fault coverage analysis, ensuring a seamless integration into your design flow.

We utilize cutting-edge DFT tools from Synopsys, Cadence, and Mentor Graphics to achieve accurate and efficient results.

Our commitment to high-quality DFT services ensures that your design meets stringent reliability and quality standards, reducing time to market and enhancing product performance.

Ready to Improve Your Design’s Testability?

Contact ISLV Semi Conductor Technologies today to learn more about how our DFT services can enhance your IC’s test coverage and yield. Let us help you deliver reliable, high-quality products to market faster with our tailored DFT solutions.

Our Services

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