Our expertise in implementing robust DFT methodologies enhances test coverage, reduces manufacturing defects, and improves yield.
ISLV Semi Conductor Technologies specializes in Design for Testability (DFT) services, ensuring your integrated circuits (ICs) are test-ready and defect-free before production. Our expertise in implementing robust DFT methodologies enhances test coverage, reduces manufacturing defects, and improves yield, resulting in cost-effective and reliable IC production.
Our DFT Services Include
We implement scan-based testing methods that simplify the testing of complex digital designs. Our scan insertion process includes the design and integration of scan chains, facilitating easier identification and diagnosis of manufacturing faults. By enabling comprehensive scan coverage, we help reduce the risk of undetected defects in your design.
Our team generates high-coverage ATPG patterns to detect stuck-at and transition faults efficiently. These patterns are designed to achieve maximum fault coverage, ensuring that manufacturing defects are identified during the testing process. We focus on minimizing the pattern count to reduce test time and cost while maintaining high coverage.
BIST structures provide a way for ICs to test themselves, offering a cost-effective solution for testing complex designs. Our BIST services include memory BIST (MBIST) and logic BIST (LBIST) implementation, enabling on-chip testing capabilities that reduce the need for expensive external test equipment and ensure high reliability in the field.
We integrate IEEE 1149.1 standard JTAG (Joint Test Action Group) and boundary scan architectures into your design, allowing for efficient board-level testing and in-system debugging. This solution facilitates easier diagnosis of board interconnect issues and provides access to internal test points, enabling comprehensive testing even after packaging.
Our DFY services focus on enhancing the manufacturability and testability of your design. By identifying potential yield detractors during the design phase, we implement design modifications that improve the overall yield of your chips. This proactive approach reduces the likelihood of costly rework and increases the profitability of your production runs.
We perform detailed fault coverage analysis to evaluate the effectiveness of test patterns. Our team identifies low-coverage areas and implements strategies to improve test efficiency. This ensures that your design is thoroughly validated and ready for mass production, minimizing the risk of defects slipping through the testing process.
With years of experience in DFT techniques, our engineers are well-versed in the latest industry standards and best practices.
We offer end-to-end DFT solutions, from scan insertion to fault coverage analysis, ensuring a seamless integration into your design flow.
We utilize cutting-edge DFT tools from Synopsys, Cadence, and Mentor Graphics to achieve accurate and efficient results.
Our commitment to high-quality DFT services ensures that your design meets stringent reliability and quality standards, reducing time to market and enhancing product performance.
Contact ISLV Semi Conductor Technologies today to learn more about how our DFT services can enhance your IC’s test coverage and yield. Let us help you deliver reliable, high-quality products to market faster with our tailored DFT solutions.
Contact us for a free consultation or to explore our range of services in more detail.